TESCAN AMBER

Versatile nanoanalytical FIB-SEM to expand your materials research capabilities

Home Product Portfolio TESCAN FIB-SEM Solutions for Materials Science TESCAN AMBER

High precision micro sample preparation
Ultra-high resolution field-free SEM imaging and nanoanalysis
Extended field of view and easy navigation
Multi-site process automation

Multi-modal FIB-SEM tomography
Easy-to-use modular software user interface
Attractive optional packages for various applications

: Array of micro-compression pillars

: A cross section through a defect in a multi-layered coating

: Wide Field mode for large sample imaging and navigation