- High-resolution and high-contrast imaging of nextgen materials (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures)
- Excellent platform suitable for SEM/STEM metrology at sub-nanometer scale
- Fast setup of the electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™
- Multi-detector system TriBE™ and TriSE™ for sample nanocharacterization
- Intuitive software modular platform designed for effortless operation regardless users’ skill level
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- Black Si with Au nanoparticles
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- Black Si with Au nanoparticles
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- STEM image of mesoporous silica