TESCAN AMBER X

A unique combination of Plasma FIB and field-free UHR FE-SEM for multiscale materials characterization

Home Product Portfolio TESCAN FIB-SEM Solutions for Materials Science TESCAN AMBER X

High throughput, large area FIB processing up to 1 mm
Ga-free microsample preparation
Ultra-high resolution, field-free FEG-SEM imaging and analysis
In-lens SE and BSE detection

Resolution optimization for high-throughput, multi-modal FIB-SEM tomography
Superior field of view for easy navigation
Essence™ easy-to-use, modular graphical user interface

: 1 mm cross-section through a Li-ion battery electrode

: Large-volume 3D EBSD analysis

: Ga-free APT sample preparation